5th
RD50 - Workshop on
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Location: Room A
Dipartimento di Astronomia e Fisica dello Spazio,
Largo E. Fermi 2, Firenze, Italy
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Time | |||
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9:20 |
Welcome |
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Session I : Defect and Material
Characterization |
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Time | Title and Authors | Speaker | Abstract |
9:40 |
??? A. Ruzin, I. Torchinski Tel Aviv University |
Arie Ruzin (Tel Aviv University) |
?? |
10:00 |
Comparative studies of defect behavior
in deuterated and nondeuterated n-type Si J. H. Bleka,1 E. V. Monakhov,1 A. Ulyashin,1 A. Yu. Kuznetsov,1 B. S. Avset,2 and B. G. Svensson1 1)Department of Physics, Physical Electronics, University of Oslo; 2)SINTEF ICT, Microsystems |
Eduard Monakhov (University of Oslo) |
abstract talk |
10:20 |
The
X defect in Epi/Cz silicon diodes after high doses
of Co60-gamma irradiation I.
Pintilie, E. Fretwurst*, G. Lindstroem* and J. Stahl* NIMP
Bucharest, Romania * Hamburg University, Institute for Experimental Physics |
I. Pintilie (NIMP Bucharest) |
abstract talk |
10:40 |
Studies of defect centres in
high-energy proton irradiated epitaxial silicon using DLTS and HRPITS
techniques R. Kozlowski (a), P. Kaminski (a), E. Nossarzewska-Orlowska (a), E. Fretwurst (b), G. Lindstroem (b), and M. Pawlowski (a, c) (a)Institute of Electronic Materials Technology (Warsaw),(b) Institute for Experimental Physics, University of Hamburg, (c)Military University of Technology (Warsaw) |
Roman Kozlowski (Inst. Electr.Mat. Techn.) |
abstract talk |
11:00-11:30 |
Coffee Break |
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11:30-12:30 |
Discussion: Session Defect
and Material Characterization |
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12:30-14:00 |
Lunch |
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Session II : Defect Engineering |
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14:00 |
Interaction of residual hydrogen with radiation
defects in silicon particle detectors |
Leonid Makarenko |
abstract talk |
14:20 |
Study of leakage current and effective
dopant concentration in irradiated epi-Si detectors I. Dolenc, V. Cindro, G. Kramberger, I. Mandic, M. Mikuz Jozef Stefan Institute, Ljubljana, Slovenia |
irena dolenc (Jozef Stefan Institute) |
abstract talk |
14:40 | INFLUENCE OF GROWING AND DOPING
METHODS ON RADIATION HARDNESS OF n?Si IRRADIATED BY FAST-PILE NEUTRONS
A.P. Dolgolenko, P.G. Litovchenko, A.P. Litovchenko, M.D. Varentsov,V.F. Lastovetsky, G.P. Gaidar, D. Bisello, A. Candelori. Institute for Nuclear Research NASU; Istituto Nazionzle di Fisica Nucleare and Dipartamento di Fisica Universita di Padova |
Lytovchenko Piotr (KINR) |
abstract talk |
15:00-16:00 |
Discussion: Session Defect
Engineering |
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16:00-16:30 |
Coffee Break |
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Session
III: New Materials Convener: Juozas Vaitkus |
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Time | Title and Authors | Speaker | Abstract |
16:30 |
Thick semi-insulating GaN properties |
Juozas Vaitkus (Inst. Mater.Sci.& Appl. Research, Vilnius U) |
abstract talk |
16:50 |
Intentionaly Partly Damaged Si Radiation
Detectors |
Michael Solar (Czech Technical University in Prague) |
talk |
17:10-18:30 |
Discussion
session: New Materials Convener: Juozas Vaitkus
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Friday, 15 October 2004 |
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Session
IV: Pad Detector Characterisation Convener and Chairperson: Jaakko Harkonen |
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Time | Title and Authors | Speaker | Abstract |
9:00 |
Possible mechanism for the frequency
dependence of the depletion voltage from CV measurements for
irradiated Si detectors. D.Campbell, A.Chilingarov and T.Sloan Department of Physics, Lancaster University, Lancaster, LA1 4YB, UK |
Alex Chilingarov (Lancaster University) | abstract talk |
9:20 |
Laser for testing of microstrip
silicon detectors Dolezal Z.,Kodys P. IPNP, MFF, Charles University, Prague |
Peter Kodys (Charles University, Prague) | talk |
9:40 |
TCT Studies in FZ, DOFZ and MCz
Silicon A Bates (1,2), M Moll(1), K Kaska(3) (1) CERN (2) The University of Glasgow (3) Technical University of Vienna |
Alison Bates (University of Glasgow & CERN) |
abstract talk |
10:00 |
Neff tuning in Cz-Si detectors by
isothermal annealing M. Bruzzi, Z. Li, J. Haerkoenen INFN & University of Florence; BNL, Upton, NY; HIP Helsinki, Finland |
Mara Bruzzi
(INFN&University Firenze) |
abstract talk |
A New Approach in Si Detector
Radiation Hardness/Tolerance Improvement Z.Li and J.Harkonen |
Zheng Li | talk | |
10:20 |
Gamma Radiation Induced Effects in Si
p-i-n Photo Diodes I. Genchev(a,b), M. Van Uffelen(a), F. Berghmans(a,b), K. Panajotov(b), K. Gill(c), H. Thienpont(b) a) SCK-CEN Mol, Belgium; b) VUB Brussels, Belgium; c) CERN, Geneva, Switzerland. |
Ivan Genchev (SCK-CEN Belgium) |
abstract talk |
11:00-11:30 |
Coffee Break |
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11:30 |
Preliminary electrical characterization of n-on-p
devices fabricated at ITC-irst
C. Piemonte
ITC-irst |
C. Piemonte ITC-irst
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abstract talk |
11:50-12:50 |
Discussion
session: Pad detector Characterisation |
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12:50-14:20 |
Lunch |
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14:20-16:20 | RD50
- Collaboration Board Meeting (closed session - Room A) (closed session: open for collaboration board members and proxies only) Chairperson: Eckhart Fretwurst |
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16:20-16:50 |
Coffee Break |
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20:00 |
Workshop dinner downtown Florence (40 Euro) Restaurant Pane e Vino |
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Saturday, 16 October 2004 |
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Session
V: Full Detector Systems Convener and Chairperson: Gianluigi Casse |
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Time | Title and Authors | Speaker | Abstract |
9:20 |
Testing of Czochralski silicon
detector modules P. Luukka1, E. Anttila1, H. Katajisto1, E. Haeggström1, J. Härkönen1, T. Mäenpää1, A. Onnela2 and E. Tuovinen1 1) Helsinki Institute of Physics 2) CERN |
Panja Luukka (HIP, Finland) | abstract talk |
9:40 |
Moisture sensitivity of AC coupled
silicon strip sensors F.Hartjes on behalf of the ATLAS SCT collaboration NIKHEF |
Fred Hartjes (NIKHEF, Amsterdam) | talk |
10:00 |
Distortion
of resolution for angular tracks in microstrip detectors after
irradiation |
G. Casse (Liverpool) | abstract talk |
10:20 |
Pixel Devices on the common RD50 Strip
Detector Mask Set T. Rohe, PSI |
T. Rohe (PSI) |
abstract abstract talk |
10:40 |
A
Pixel Readout Chip for Sensor Characterization Horisberger, R. and Rohe, T. PSI |
T. Rohe (PSI) | |
11:00 |
Results on Technotest subproject:
correlation between material properties, processing and
characteristics of Si detectors irradiated by neutrons Elena Verbitskaya et al. Ioffe Physico-Technical Institute RAS, Brookhaven National Laboratory, Helsinki Institute of Physics, Iosef Stefan Institute, Glasgow University |
Elena Verbitskaya (Ioffe) |
abstract talk |
11:00-11:30 |
Coffee Break | ||
11:30-12:30 |
Discussion
session on Full Detector Systems
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12:30-14:00 |
Lunch |
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Session
VII: New Structures Chairperson: Zheng Li (BNL) |
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Time | Title and Authors | Speaker | Abstract |
14:00 |
Charge Collection efficiency
measurements on thinned FZ Si diodes irradiated with Li ions M. Bruzzi, E. Focardi, C. Tosi, A. Candelori, V. Khomenkhov, C. Piemonte, M. Boscardin, N. Zorzi, S. Ronchin INFN & University of Florence INFN & University of Padova ITC-IRST, Trento |
Mara Bruzzi (INFN&University of Firenze) | abstract talk |
14:20 |
Analysis and simulation of Charge
Collection Efficiency in Silicon Thin Detectors M. Petaseccaa,b,*, F. Moscatellia,b,c, G.U. Pignatela,b aDIEI, University of Perugia, via G. Duranti, 93 – 06125 Perugia - Italy bINFN sez.Perugia, via Pascoli, 10 – 06100 Perugia - Italy cIMM-CNR sez. Bologna, via Gobetti, 101 – 04129 Bologna - Italy |
Marco Petasecca (University of Perugia) | abstract talk |
14:40 |
Comparison of radiation hardness of
P-in-N, N-in-N and N-in-P silicon pad detectors in std-FZ, oxg-FZ, and
MCZ M. Lozano, G. Pellegrini, C. Fleta, J. M. Rafí, M. Ullán, F. Campabadal, G. Casse, P. Allport IMB-CNM (Barcelona) University of Liverpool |
Manuel Lozano (CNM) |
abstract talk |
15:00 |
First measurements of Semi3D diodes
before and after irradiation Amit Roy and Daniela Bortoletto, Purdue University Zheng Li, BNL |
Zheng Li (BNL) |
talk |
15:20 |
R. Bates, V. O’Shea, C. Parkes, V. Wright, A. Blue |
Richard Bates (Glasgow University) |
talk |
15:40 |
Discussion session on New
Structures:
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16:00-16:30 |
Coffee Break |
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16:30 -- Closing Remarks |
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16:45 End of Workshop |
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