2nd RD50 Workshop - Program - 18-10 May 2003 |
Last update: 01/07/2003 16:59 M.M
The Workshop will take place in Building 40 - room: S2-B01
- printable version (program overview) pdf-file
- printable version (detailed program) pdf-file
Agenda overview / detailed program and transparencies are given below
Sunday
- May 18 |
Monday
- May 19 |
Tuesday
- May 20 |
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8:50 | Session
III. Defect Engineering (DE) |
8:50 | SessionVI. New Materials (NM) |
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8:50 | G.Lindström, RadTol Si (CiS-HH project) | 8:50 | A.Henry, SiC activities in Linköping | ||
9:10 | Z.Li, Cz Si after n ,p, gamma irr. | 9:10 | P.Sellin, Ion beam microscopy, SiC,GaN | ||
9:30 | E.Tuovinen, CZ Si after low energy p irr. | 9:30 | A.Scorzoni, SiC p-n-junctions | ||
9:50 | M.Bruzzi, TSC on gamma irr. DOFZ | 9:50 | J.Vaitkus, Irradiated SI-GaN, SiC | ||
10:10 | Coffee Break | 10:10 | Coffee Break | ||
10:40 | A.Candelori, Li-ion irradiatiion of Si | 10:40 | R.Bates, Simulation of SiC detectors | ||
11:00 | P.Lytovchenko, pre-irradiated Si | 11:00 | G.Wagner, CVD 4H-SiC growth | ||
11:20 | V.Boisvert, Simulation of O2 formation | 11:20 | B.Sopko, GaAs for detectors | ||
11:40 | DE -Discussion | 11:40 | M.Bruzzi, CCE and PL of epitaxial SiC | ||
12:00 |
NM -Discussion |
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12:10 | Lunch | 12:30 | Lunch | ||
13:00 | Session I. Defect and material characterization (DMC) |
13:30 | Session IV. Full Detector Systems (FDS) |
14:00 | Discussions in Working Groups |
13:00 |
Welcome |
13:30 | P.Lukka, Cz detectors - 10MeV p irr. | 14:30 17:30 |
Collaboration Board Meeting |
13:10 | J.Adey, P-type boron doped Si | 13:50 | S.M. i Garcia, Annealing of CCE | ||
13:30 | G.Alfieri, V2O in oxygenated Si | 14:10 | R.Roeder, CiS Technologies | ||
13:50 | I.Pintilie, V2O model | 14:30 | V.Eremin, CCE of ATLAS strip detectors | ||
14:10 | cancelled | 14:50 |
P.Kodys, Laser/beta test set-up in Prague |
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14:30 | A.Cavallini,SiC-rad. induced levels | 15:10 | G.Casse, Oxygenated p-type detectors | ||
14:50 | P.Kaminski, Defects in SI InP:Fe | ||||
15:10 | B.Svensson, RD50 DLTS calibration study | . | |||
15:30 |
Coffee Break |
15:30 | Coffee Break | ||
16:00 |
DMC discussion |
16:00 |
G.Casse, RD50 strip detector mask |
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16:20 |
FDS discussion |
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16:30 | Session II. Pad detector characterization (PDC) |
16:50 | Session V. New Structures (NS) |
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16:30 | T.Lari, Charge trapping simulation | 17:10 | A.G.Bates, LHCb near beam tracking | ||
16:50 | V.Radicci, 34MeV p irradiation -Reverse annealing | 17:20 | Z.Li, Semi 3D developments in the US | ||
17:10 | V.Eremin, Electric field manipulation | 17:30 | P.Roy, 3D detectors irr. with p and pi | ||
17:30 | O.Krasel, TCT: Trapping time measurements | 17:50 | D.Contarato, Pixel detector simulation | ||
17:50 | J.Harkonen, RD50 Pad Detector Mask | 18:10 (30min) |
NS discussion |
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18:10 (30min) |
PDC discussion | ||||
19:15 Social Dinner
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Sunday, 18.5.2003 - Afternoon - Building 40 - room: S2-B01 |
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Welcome |
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Session
I : Defect
and Material Characterization Convener: Bengt Svensson Chairperson: Eckhart Fretwurst |
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13:10 | I.1 - Radiation damage in p-type boron doped Si (pdf
- 870KB) James Adey1, R. Jones1, P. R. Briddon2 1, University of Exeter, U.K. 2, University of Newcastle, U.K. |
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13:30 | I.2 - Evidence for identification of divacancy oxygen
center in high purity oxygenated Si (pdf-710KB) Giovanni Alfieri(1, E.V.Monakhov(1, B.S.Avset(2, B.G.Svensson(1 (1 Department of Physics, Physical Electronics, University of Oslo,PO Box 1048 Blindern, N-0316 Oslo,Norway (2 SINTEF,Electronics and Cybernetics,PO Box 124 Blindern,N-0314 Oslo,Norway |
Abstract |
13:50 | I.3 - Divacancy Oxygen model - fake or fact? (pdf-540KB) Ioana Pintilie(1,2), E. Fretwurst(2), G. Lindstroem(2), J. Stahl(2), Z. Li(3) (1) NIMP, Bucharest, Romania (2) Hamburg University, Germany (3) BNL, USA |
Abstract |
14:10 | I.4 - cancelled | |
14:30 | I.5 - Silicon carbide: electronic levels associated to
irradiation (pdf-437KB) Anna Cavallini*, A. Castaldini*, F. Nava# *Department of Physics University of Bologna #Department of Physics University of Modena |
Abstract |
14:50 | I.6 - Characterisation of defect centres in SI InP:Fe as a
starting material for nuclear radiation detectors (pdf-600KB) Pawel Kaminski, Roman Kozlowski and Michal Pawlowski Institute of Electronic Materials Technology (ITME), Wolczynska 133, 01-919 Warszawa, Poland |
Abstract |
15:10 | I.7 - RD50 - DLTS-calibration study (pdf-200KB) Bengt Svensson University of Oslo, Department of Physics |
Abstract |
15:30 Coffee Break (30 min) |
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16:00 |
Discussion
Session: Defect and Material Characterization |
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Session
II: Pad
Detector Characterization Chairperson: Michael Moll |
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16:30 | II.1 - Simulation of charge trapping
in irradiated silicon (pdf-560KB) Tommaso Lari, C. Troncon INFN Milano |
Abstract |
16:50 | II.2 - Reverse annealing studies on standard diodes
irradiated with 34 MeV proton beam. (pdf-1.1MB) D. Creanza, M. Depalma, N.Manna, Valeria Radicci Bari University and INFN of Bari |
Abstract |
17:10 | II.3 - Physics of detectors based on electric field
manipulation (selected results of CERN-INTAS-RD39 project) (pdf
800 KB) Vladimir Eremin, on behalf of RD39 collaboration and INTAS-RD39 group Ioffe Physico-Technical Institute, St.Petersburg, Russia |
Abstract |
17:30 | II.4 - Measurement of the Trapping Time Constants in Silicon
with the Transient Current Technique (pdf-825KB) Olaf Krasel, Claus Gößling, Jonas Klaiber-Lodewigs, Reiner Klingenberg, Martin Maß, Silke Rajek, Renate Wunstorf Lehrstuhl für Experimentelle Physik IV Universität Dortmund |
Abstract |
17:50 | II.5 - RD50 common pad detector mask design project -
current
status Jaakko Harkonen |
Abstract |
18:10 |
Discussion
Session: Pad Detector Characterization |
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..... end of first day ...
... end of first day ... |
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Monday, 19.5.2003 - Morning - Building 40 - room: S2-B01 |
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Session
III: Defect
Engineering Convener: Eckhart Fretwurst Chairperson: |
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8:50 | III.1 - Improved Radiation Tolerance of Silicon Detectors for
HEP Applications; Results from the CiS-HH Project (pdf-330KB) G. Lindstroem (a), D. Contarato(a), Eckhart Fretwurst(a), F. Hoenniger(a), G. Kramberger(b), I. Pintilie(a,c), R. Roeder (d), A. Schramm(a), J. Stahl (a) (a): Institute for Experimental Physics, Univ. of Hamburg (b): DESY, Hamburg, (c): National Institute for Material Physics, Bucharest, (d) CiS Institute for Microsensors, Erfurt |
Abstract |
9:10 | III.2 - Radiation Hardness of High resistivity CZ Si
Detectors after Gamma, Neutron and Proton Radiations (pdf-6.5MB) Zheng Li1, J. Harkonen 2, W. Chen1, J. Kierstead1, E.Tuominen2, E. Tuovinen2, E. Verbitskaya3, and V. Eremin3 1 Brookhaven National Laboratory, Upton, NY 11973-5000, USA 2 Helsinki Institute of Physics, P.O. Box 64, University of Helsinki, Helsinki, 00014, Finland 3 Ioffe Physico-Technical Institute, Polytechnicheskaya Str. 26, St. Pertersburg, 194021, Russia |
Abstract |
9:30 | III.3 - Radiation hardness of Czochralski silicon studied by
low energy protons (pdf-521KB) Esa Tuovinen1, J.Harkonen1, K.Lassila-Perini1, P.Luukka1, J.Nysten1, E.Tuominen1, P.Laitinen2, I.Riihimaki2, A.Virtanen2 1 Helsinki Institute of Physics 2 Jyvaskyla University Accelerator Laboratory |
Abstract |
9:50 | III.4 - TSC analysis of gamma-irradiated standard and DOFZ Si
diodes in a wide temperature range (pdf-69KB) Mara Bruzzi, D. Menichelli, S. Miglio, M. Scaringella I.N.F.N. Firenze - Dipartimento di Energetica, Via S. Marta 3, 50139 Firenze, Italy |
Abstract |
10:10 Coffee Break (30 min) |
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10:40 | III.5 - Lithium ion irradiation of silicon diodes (pdf-151KB) Andrea Candelori (1), D. Bisello (1), M. Boscardin (2), D. Contarato (3), G. F. Dalla Betta (4), E. Fretwurst (3), A. Kaminski (1), G. Lindström (3), A. Litovchenko (1), M. Lozano (5), M. Moll (6), R. Rando (1), M. Ullán (5), A. Schramm (3), and J. Wyss (7) (1) Dipartimento di Fisica and INFN Sezione di Padova, Italy; (2) ITC-IRST, Divisione Microsistemi, Trento, Italy; (3) Universität Hamburg, Institut für Experimentalphysik, Germany; (4) Università di Trento, Dipartimento di Informatica e Telecomunicazioni, Italy; (5) Centro Nacional de Microelectrónica, Universidad Autónoma de Barcelona, Spain; (6) CERN, Genève, Switzerland; (7) Facoltà di Ingegneria, Università di Cassino, Italy. |
Abstract |
11:00 | III.6 - Radiation hard of pre-irradiated Si for detectors
(pdf-320KB)
A.P. Dolgolenko1, Petro.G. Litovchenko1, A.P.Litovchenko1, M.D. Varentsov1, V.F. Lastovetsky1, G.P. Gaidar1, A. Candelori2, D. Bisello2, M.Boscardin3, G. F. Dalla Betta4. 1 Institute for Nuclear Research NASU, av. Nauky 47, UA-03028, Kiev,Ukraine,Fax: 380/44/2654463, e-mail: plitov@kinr.kiev.ua 2 Istituto Nazionale di Fisica Nucleare and Dipartimento di Fisica,Università di Padova, via Marzolo 8, I-35131, Padova, Italy. 3 ITC-IRST, Divisione Microsistemi, Via Sommarive 18, 38050 Povo (TN),Italy 4 Università di Trento, Dipartimento di Informatica e Telecomunicazioni,via Sommarive 14, 38050, Povo (TN), Italy |
Abstract |
11:20 | III.7 - Simulation of Dimer formation (pdf-284KB) Veronique Boisvert and Michael Moll CERN |
Abstract |
11:40 |
Discussion
Session: Defect Engineering |
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12:10 - 13:30 Lunch |
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Session
IV: Full
Detector Systems Convener: Gianluigi Casse Chairperson: |
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13:30 | IV.1 - Full-size Czochralski silicon detectors irradiated
with 10 MeV protons (pdf-582KB) Panja Luukka1, S. Czellar1, A. Heikkinen1, J. Härkönen1, V. Karimäki1, T.Lampen1, J. Nysten1, E. Tuominen1, J. Tuominiemi1, E. Tuovinen1, L. Wendland1, F. Hartmann2, A. Furgeri2, P. Laitinen3, I. Riihimäki3, A. Virtanen3 1 Helsinki Institute of Physics 2 University of Karlsruhe 3 University of Jyväskylä |
Abstract |
13:50 | IV.2 - Annealing effects on the charge collection efficiency
(pdf-5.4MB)
Salvador Marti i Garcia on behalf of CNM-Barcelona, University of Liverpool and IFIC-Valencia RD50 groups |
Abstract |
14:10 | IV.3 - CiS technologies for radiation hard Silicon detectors
(pdf-2.1MB)
R.Roeder (D) CiS Institute for Microsensors gGmbH |
Abstract |
14:30 | IV.4 - Overview of results on charge collection in ATLAS
strip detectors (pdf-610KB) V. Eremin, on behalf of CERN-ATLAS SCT group Ioffe Physico -Technical Institute, St Petersburg, Russia |
Abstract |
14:50 |
IV.5 - Laser and beta source strip detector
test setup in Prague (pdf-1.7MB) Zdenek Dolezal, Peter Kodys, Petr Kubik, Pavel Reznicek Institute of Particle and Nuclear Physics, Charles University, Prague |
Abstract |
15:10 | IV.6 - First
results with oxygenated n-in-p detectors after irradiation (pdf-128KB) Gianluigi Casse, P.P. Allport, M. Lozano, S. Marti |
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15:30 Coffee Break (30 min) |
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16:00 | IV.7 - Description of the RD50 full detector system mask
(pdf-270KB) Gianluigi Casse, Liverpool University |
Abstract |
16:20 |
Discussion: Full Detector Systems |
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Session
V: New
Structures Convener/Chairperson: Mahfuzur Rahman |
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16:50 | V.1 - Improved Near Beam Particle Tracking with Radiation
Hard Si Detectors at LHCb (pdf-2MB) Alison G Bates (1), C Parkes(1), M Rahman(1), R Bates(1), M Wemyss(1), G Murphy(1), P Turner(2) and S Biagi(2) (1) The University of Glasgow (2) The University of Liverpool |
Abstract |
17:10 | V.2 - Activities of the US Chapter of CERN RD50 On the
Development of Semi-3D Si Detectors (pdf-2MB) Zheng Li On behalf of the US RD50 members: BNL, FNAL, Purdue, Rutgers, and Syracuse and observers: CMU, JHU, OSU and UCSC BNL, FNAL, Purdue, Rutgers, and Syracuse, CMU, JHU, OSU and UCSC |
Abstract |
17:30 | V.3 - Silicon 3D detectors irradiated with pions and
protons (pdf-14MB) Patrick Roy, G. Pellegrini, R. Bates, L. Haddad, V. O’Shea, K.M. Smith, V. Wright, M. Rahman Dept. of Physics and Astronomy, Glasgow University, G12 8QQ UK |
Abstract |
17:50 | V.4 - Simulation of irradiated silicon pixel detectors for
future High Energy Physics experiments (pdf-280KB) Devis Contarato1, Gregor Kramberger2 1, Institute for Experimental Physics, University of Hamburg 2, DESY, Hamburg |
Abstract |
18:10 |
Discussion
Session: New Structures |
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Collaboration Dinner We will go to the "Holiday Inn" in Thoiry in France. |
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Tuesday, 20.5.2003 - Building 40 - room: S2-B01 |
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Session
VI: New
Materials Convener: Juozas Vaitkus Chairperson: |
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8:50 | VI.1 - SiC activities at Linköping University (pdf-980KB) Anne Henry and E. Janzén Department of Physics and Measurement Technology, Linköping University, SE-581 83 Linköping, Sweden |
Abstract |
9:10 | VI.2 - Ion beam microscopy of charge transport in SiC and
GaN detectors (pdf-2.2MB) Paul Sellin, D. Hoxley, A. Lohstroh, A. Simon, L. Cunningham, M. Rahman, J. Vaitkus. University of Surrey University of Glasgow Vilnius University |
Abstract |
9:30 | VI.3 - Electrical characterization and optimization of
silicon carbide p+/n junctions for particle detectors (pdf-317KB) F. Moscatelli (a), Andrea Scorzoni (a), A. Poggi (b), G. C. Cardinali (b) and R. Nipoti (b) (a) Dipartimento d’Ingegneria Elettronica e dell’Informazione, Università di Perugia, via G. Duranti 93, 06125 Perugia Italy. (b) CNR- IMM Sezione di Bologna, via Gobetti 101, 40129 Bologna Italy. |
Abstract |
9:50 | VI.4 - Properties of irradiated SI-GaN and
activation-mokification of defects in SiC (pdf-1MB) Juozas Vaitkus (1), W. Cunningham(2), A.Galeckas (1,3), E.Gaubas (1), V.Kazukauskas (1), M.Mikuz (4), E.Noah (5), M.Rahman (2), S.Sakai (6), K.Smith (2) Vilnius University, Vilnius, Lithuania; University of Glasgow, Glasgow, UK; The Royal Institute of Technology, Stockholm, Sweden; (4) University of Ljubljana, Ljubljana, Slovenia; (5)Imperial College, London, UK; (6) University of Tokushima, Tokushima, Japan. |
Abstract |
10:10 Coffee Break (30 min) |
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10:40 | VI.5 - Simulation of SiC radiation sensors (pdf-260KB) Richard Bates, M.Rahman,W.Cunningham, T Quinn and T Nelson Glasgow University |
Abstract |
11:00 | VI.6 - Homoepitaxial growth of 4H-SiC layers in a hot wall
Chemical Vapour Deposition system (pdf-744KB) Günter Wagner Institute of Crystal Growth |
Abstract |
11:20 | VI.7 - The innovation of GaAs technology for
detectors (pdf-165KB)
B. Sopko, Z. Kohout, M.Solar, S. Pospíšil, T. Horažïovský, Dominik Chren CTU Prague |
Abstract |
11:40 | VI.8 - Charge collection and photoluminescence
characterisation of epitaxial SiC (pdf-874KB) S. Sciortino(1), G.Wagner(2), P.Vanni(3), S. Lagomarsino(1), Mara Bruzzi(1), F.Nava(3), S. Miglio(1), R. Schifano(4), A. Vinattieri (4) (1)INFN and Dipartimento di Energetica, Università di Firenze, Italy (2) Institut fur Kristallzuchtung, Max-Born-Strasse 2, D-12489 Berlin, Germany (3)Dipartimento di Fisica, Università di Modena e Reggio Emilia, Italy (4)INFM UdR Firenze, Via G. Sansone, Sesto Fiorentino, Firenze, Italy |
Abstract |
12:00 |
Discussion
Session: New Materials |
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12:30 -14:00 Lunch |
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14:00-14:30 Discussions in working groups | ||
Tuesday, 20.5.2003 - Afternoon - Building 40 - room: S2-B01 |
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14:30 |
RD50 - Collaboration Board Meeting |
Agenda |
2nd
RD50 Workshop on Radiation hard semiconductor devices for very high luminosity colliders, |