Recommendations towards a standardization of the macroscopic parameter measurements

Part I: IV and CV measurements in Si diodes

contact: Alexander Chilingarov, Lancaster University
reference: RD50 Technical Note RD50-2003-03

Recommendations towards a standardisation of the macroscopic parameter measurements

Part II: MIP CCE measurements

contact: Alexander Chilingarov, Lancaster University
reference: RD50 Technical Note RD50-2004-01

Interstrip resistance measurement
by A.Chilingarov (Lancaster University)

contact: Alexander Chilingarov, Lancaster University
reference: RD50 Technical Note RD50-2009-01

RD50-2009-01 published on CDS as:
PH-EP-Tech-Note-2011-001

Generation current temperature scaling
by A.Chilingarov (Lancaster University)

contact: Alexander Chilingarov, Lancaster University
reference: RD50 Technical Note RD50-2011-01 (pdf )
Experimental data vs.2, July 2012 (pdf)

outdated:Experimental data vs.1 (pdf)

PH-EP-Tech-Note-2013-001

Now published in JINST

Authors :A.Chilingarov

Title:Temperature dependence of the current generated in Si bulk

  2013_JINST_8_P10003

http://dx.doi.org/10.1088/1748-0221/8/10/P10003

...please use this reference!

Distortion of the CV characteristics by a high current

by A.Chilingarov (Lancaster University)

contact: Alexander Chilingarov, Lancaster University
draft